Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference14 articles.
1. Excess carrier recombination in P implanted silicon
2. New contactless method for lifetime measurement in semiconductor wafers
3. , , , and , Proc. Internat. Conf. Ion Implantation, Rossendorf, 1972 Central Inst. Nuclear Res., (p. 191).
4. see [4] (p. 33).