X-ray topographic observations of dislocation–ferromagnetic domain interaction in Fe−3% Si crystals
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Anomalous Transmission of X-Rays in Fe-3 pct Si Crystals and the Observation of Ferromagnetic Domains
2. Observations of Ferromagnetic Domains by Anomalous Transmission of X-Rays. The Effects of Variation in the Reflecting Plane
3. Comparison of Bitter Patterns and X‐Ray Images of Domains in Fe–Si Crystals
4. Ph.D. Thesis, Brown University, Providence, Rhode Island 1970.
5. and , to be published.
Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-ray and neutron topographical studies of magnetic materials;Physica B: Condensed Matter;1993-10
2. Characterization of the electrical bias induced strain variation in metal–oxide–semiconductor field effect transistors using x‐ray double crystal topography;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1992-07
3. X-Ray Topographic Observations of Magnetic Domain Structures and 180° Walls in a (100) Crystal of Pure Iron under an External Magnetic Field;Japanese Journal of Applied Physics;1992-06-15
4. X-Ray Topographic Observation of a New 180° Wall and <100> Image in Pure Iron Crystal;Japanese Journal of Applied Physics;1992-02-15
5. Double-crystal X-ray topography characterization of an electrical-bias-induced stress variation in metal-oxide-semiconductor field effect transistors;Thin Solid Films;1991-12
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