High resolution electron microscopy of semiconductor interfaces-Reference-Cited by-同舟云学术

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High resolution electron microscopy of semiconductor interfaces

Published:1995-07-16 Issue:1 Volume:150 Page:127-140
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Gutakovskii A. K.,Fedina L. I.,Aseev A. L.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Trends in Atomic Resolution Electron Microscopy

2. Application of Electron Microscopy to Semiconductor Materials Research

3. Experimental High Resolution Electron Microscopy, Clarendon Press, Oxford 1991.

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