EXAFS studies on superficial regions by means of total reflection
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Extended x‐ray‐absorption fine structure (EXAFS) and its application to surface structure
2. Extended-x-ray-absorption-fine-structure study of theBr2-graphite system
3. New application of extended x‐ray absorption fine structure (EXAFS) as a surface probe‐nature of oxygen interaction with a ruthenium catalyst
4. EXAFS in photoelectron yield spectra at K edges of Cu, Ni, and Ge
5. Extended-x-ray-absorption-fine-structure studies of low-Zatoms in solids and on surfaces: Studies ofSi3N4, SiO2, and oxygen on Si(111)
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