Evidence for Layered Structure of Boron Nitride Films Detected by Rutherford Backscattering-Reference-Cited by-同舟云学术

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Evidence for Layered Structure of Boron Nitride Films Detected by Rutherford Backscattering

Published:1996-06-16 Issue:2 Volume:155 Page:K1-K4
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Plass M. F.,Fukarek W.,Kolitsch A.,Mäder M.,Möller W.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Growth and characterization of cubic boron nitride thin films

2. Preparation of cubic boron nitride films by use of electrically conductive boron carbide targets

3. Ion‐assisted pulsed laser deposition of cubic boron nitride films

4. Nuclear reaction analyses of boron nitride films deposited by ion beam based techniques

5. , , and , Surface Coating Technol. (accepted).

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1. Effect of Al additions and AlN interlayers on the stabilization of cBN sputtered thin films;Diamond and Related Materials;2004-09

2. Origin of residual stress in the formation of boron nitride film by sputtering with Ar ions;Journal of Applied Physics;2003-09

3. Superhard coatings in C-B-N systems;Handbook of Thin Films;2002

4. Dependence of the stress of c-BN films on the major deposition parameters: theoretical and experimental studies;Thin Solid Films;2001-11

5. Review of advances in cubic boron nitride film synthesis;Materials Science and Engineering: R: Reports;1997-12

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