Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry-Reference-Cited by-同舟云学术

Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry

Author:

Shishido Rie¹,Fujii Makiko²,Seki Toshio³,Aoki Takaaki⁴,Matsuo Jiro²,Suzuki Shigeru¹

Affiliation:

1. Institute of Multidisciplinary Research for Advanced Materials; Tohoku University; 2-1-1 Katahira, Aoba-ku Sendai Miyagi 980-8577 Japan

2. Quantum Science and Engineering Center; Kyoto University; Gokasho Uji Kyoto 611-0011 Japan

3. Department of Nuclear Engineering; Kyoto University; Gokasho Uji Kyoto 611-0011 Japan

4. Department of Electronic Science and Engineering; Kyoto University; Nishikyo-ku Kyoto 615-8510 Japan

Funder

Network Joint Research Center for Material and Device

Promotion Grant from the Iron and Steel Institute of Japan

Publisher

Wiley

Subject

Organic Chemistry,Spectroscopy,Analytical Chemistry

Link

Reference15 articles.

4. The magic of cluster SIMS;Winograd;Anal. Chem.,2005

5. Influence of primary ion bombardment conditions on the emission of molecular secondary ions;Kersting;Appl. Surf. Sci.,2004

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