Round-robin layer-thickness determination: Toward reliable reference-free X-ray spectrometry-Reference-Cited by-同舟云学术

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Round-robin layer-thickness determination: Toward reliable reference-free X-ray spectrometry

Published:2018-09-23 Issue:1 Volume:48 Page:3-7
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrometry

Author:

Sakurai Kenji¹^ORCID,Kurokawa Akira²

Affiliation:

1. National Institute for Materials Science (NIMS); Tsukuba Ibaraki Japan

2. National Metrology Institute of Japan (NMIJ); National Institute of Advanced Industrial Science and Technology (AIST); Tsukuba Ibaraki Japan

Publisher

Wiley

Subject

Spectroscopy

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/xrs.2978/fullpdf

Reference19 articles.

1. Quantitative X-Ray Spectrometry

2. The theoretical derivation of fluorescent X-ray intensities from mixtures

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. X-ray fluorescence analysis of solid-state films, layers, and coatings;Radiation Physics and Chemistry;2022-08

2. Role of Reference Material and Use in Surface Analysis;Journal of Surface Analysis;2021

3. Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films;Journal of Analytical Atomic Spectrometry;2020

4. Atomic spectrometry update: review of advances in the analysis of metals, chemicals and materials;Journal of Analytical Atomic Spectrometry;2019

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