Thickness Dependence of Photoconductance in Strained BiFeO3 Thin Films With Planar Device Geometry-Reference-Cited by-同舟云学术

Thickness Dependence of Photoconductance in Strained BiFeO3 Thin Films With Planar Device Geometry

Published:2017-11-03 Issue:1 Volume:12 Page:1700301
ISSN:1862-6254
Container-title:physica status solidi (RRL) - Rapid Research Letters
language:en
Short-container-title:Phys. Status Solidi RRL

Author:

Huang Zhifeng¹,Li Peilian¹,Fan Zhen¹^ORCID,Fan Hua¹,Luo Qiuyuan¹,Chen Chao¹,Chen Deyang¹,Zeng Min¹,Qin Minghui¹,Zhang Zhang¹,Lu Xubing¹,Gao Xingsen¹,Liu Jun-Ming²

Affiliation:

1. Institute for Advanced Materials, Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, South China Academy of Advanced Optoelectronics; South China Normal University; 510006 Guangzhou China

2. Laboratory of Solid State Microstructures; Nanjing University; No. 22 Hankou Rd Gulou District 210093 Nanjing China

Funder

National Key Research Program of China

State Key Program for Basic Researches of China

National Natural Science Foundation of China

Science and Technology Planning Project of Guangdong Province

Natural Science Foundation of Guangdong Province

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Reference29 articles.