Dynamic photoluminescence lifetime imaging for the characterisation of silicon wafers-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Dynamic photoluminescence lifetime imaging for the characterisation of silicon wafers

Published:2010-10-28 Issue:1 Volume:5 Page:25-27
ISSN:1862-6254
Container-title:physica status solidi (RRL) - Rapid Research Letters
language:en
Short-container-title:Phys. Status Solidi RRL

Author:

Herlufsen Sandra,Ramspeck Klaus,Hinken David,Schmidt Arne,Müller Jens,Bothe Karsten,Schmidt Jan,Brendel Rolf

Funder

German state of Lower Saxony

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssr.201004426/fullpdf

Reference11 articles.

1. Photoluminescence imaging of silicon wafers

2. M. The Proc. 22nd EUPVSEC, Milan, 354 (2007).

3. Photoconductance-calibrated photoluminescence lifetime imaging of crystalline silicon

4. T. Trupke Proc. 18th Workshop on Cryst. Silicon Solar Cells & Modules, Vail, USA, 2008, p. 88.

5. Determination of local minority carrier diffusion lengths in crystalline silicon from luminescence images

Cited by 34 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Deeper Insight into the Mechanisms Behind Sputter Damage in Silicon Solar Cells Based on the Example of Nanocrystalline Silicon Carbide;Advanced Physics Research;2024-07-04

2. Three-dimensional model of a multicrystalline silicon ingot based on wafer photoluminescent images;SiliconPV 2021, The 11th International Conference on Crystalline Silicon Photovoltaics;2022

3. Advanced photoluminescence imaging using non‐uniform excitation;Progress in Photovoltaics: Research and Applications;2021-10-11

4. A Dynamic Calibration Method for Injection‐Dependent Charge Carrier Lifetime Measurements;Small Methods;2021-07-24

5. A silicon carbide-based highly transparent passivating contact for crystalline silicon solar cells approaching efficiencies of 24%;Nature Energy;2021-04-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3