Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness-Reference-Cited by-同舟云学术

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Depth profiling analysis of barrier-type anodic aluminium oxide films formed on substrates of controlled roughness

Published:2010-05-11 Issue:1-2 Volume:43 Page:183-186
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Trigoulet N.,Tuccitto N.,Delfanti I.,Licciardello A.,Molchan I. S.,Skeldon P.,Thompson G. E.,Tempez A.,Chapon P.

Funder

European Commission through the 6th Framework Programme

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.3410/fullpdf

Reference9 articles.

1. Sputter depth profile analysis of interfaces

2. The effects of ion bombardment sputtering and atomic transport related roughening and smoothing on depth profiling resolution

3. Ultra shallow doping profiling with SIMS

4. Depth resolution improvement in AES sputter profiling of Ni/Cr multilayers on rough substrates using two ion beams

5. Influence of surface roughness on the depth resolution of GDOES depth profiling analysis

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2. Depth profile analysis with glow discharge spectrometry;Journal of Analytical Atomic Spectrometry;2017

3. Effect of surface morphology changes of Ti-6Al-4V alloy modified by laser treatment on GDOES elemental depth profiles;J. Anal. At. Spectrom.;2013

4. Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials;Journal of Analytical Atomic Spectrometry;2011

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