Laser-induced breakdown spectroscopy for photovoltaic silicon wafer analysis-Reference-Cited by-同舟云学术

Laser-induced breakdown spectroscopy for photovoltaic silicon wafer analysis

Published:2011-11-09 Issue:4 Volume:20 Page:463-471
ISSN:1062-7995
Container-title:Progress in Photovoltaics: Research and Applications
language:en
Short-container-title:Prog. Photovolt: Res. Appl.

Author:

Darwiche S.¹,Benmansour M.²,Eliezer N.¹,Morvan D.¹

Affiliation:

1. ENSCP - Chimie ParisTech; 11, rue Pierre et Marie Curie 75005 Paris France

2. UPMC, 1 place Jussieu; 75005 Paris France

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pip.1209/fullpdf

Reference31 articles.

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2. Quantitative analysis of room temperature luminescence of c-Si wafers excited by short laser pulses;Timoshenko;Journal of Applied Physics,1999

3. Extented infrared response of silicon solar cells and the impurity photovoltaic effect;Keevers;Solar Energy Materials and Solar Cells,1996

4. Laser-induced breakdown spectrometry - applications for production control and quality assurance in the steel industry;Noll;Spectrochimica Acta Part B,2001

5. On-line iron-ore slurry monitoring for real-time process control of pellet making processes using laser-induced breakdown spectroscopy: graphitic vs total carbon detection;Barette;Spectrochimica Acta Part B,2001

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