Infrared Vibrational Spectroscopy of Functionalized Atomic Force Microscope Probes using Resonantly Enhanced Infrared Photoexpansion Nanospectroscopy-Reference-Cited by-同舟云学术

Infrared Vibrational Spectroscopy of Functionalized Atomic Force Microscope Probes using Resonantly Enhanced Infrared Photoexpansion Nanospectroscopy

Published:2019-05-24 Issue:10 Volume:3 Page:1900018
ISSN:2366-9608
Container-title:Small Methods
language:en
Short-container-title:Small Methods

Author:

Jin Mingzhou¹^ORCID,Belkin Mikhail A.¹

Affiliation:

1. Department of Electrical and Computer Engineering Microelectronics Research Center The University of Texas at Austin 10100 Burnet Road Austin TX 78758 USA

Funder

Welch Foundation

National Science Foundation

Publisher

Wiley

Subject

General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/smtd.201900018

Reference32 articles.

1. Chemical force microscopy for hot-embossing lithography release layer characterization

2. CHEMICAL FORCE MICROSCOPY

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4. Sensing Discrete Streptavidin-Biotin Interactions with Atomic Force Microscopy

5. Atomic force microscope imaging contrast based on molecular recognition

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