1. Symposium, on East Atom and Ion Induced Mass Spectrometry of Nonvolatile Organic Solids
2. “Notes on Nomenclature,” Presented at 30th Ann. Conf. Am. Soc. Mass Spectrom. Allied Topics, Honolulu, HI, 1982; book of abstracts, pp. 901-907.
3. “Eighteen Years of SIMS: A Bibliography of SIMS, 1958-1975A.” In: “Microbeam Analysis”; ed.; San Francisco Press: San Francisco, 1980; pp. 289-309.
4. “Recent Developments in Secondary Ion Mass Spectrometry, A Bibliography of SIMS, 1976-1980”; Proc. 16th Ann. Conf. Microbeam Analysis Soc., 1981; pp. 342-378.
5. Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry