X-ray absorption spectroscopy study of buried Co layers in the Co/Mo2C multilayer mirrors-Reference-Cited by-同舟云学术

X-ray absorption spectroscopy study of buried Co layers in the Co/Mo2C multilayer mirrors

Published:2016-11-09 Issue:3 Volume:49 Page:205-209
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Yuan Yanyan¹²,Le Guen Karine¹²,Tu Yuchun¹²³,Zhu Jingtao³,Wang Zhanshan³,Li Wenbin³,Wen Mingwu³,Mény Christian⁴,Yu Haisheng⁵,Huang Yuying⁵,Wei Xiangjun⁵,Jonnard Philippe¹²

Affiliation:

1. Laboratoire de Chimie Physique-Matière et Rayonnement; Sorbonne Universités, UPMC Univ Paris 06; Paris France

2. Laboratoire de Chimie Physique-Matière et Rayonnement; CNRS UMR 7614; Paris France

3. Institute of Precision Optical Engineering, Department of Physics; Tongji University; Shanghai 200092 China

4. Institut de Physique et Chimie des Matériaux de Strasbourg; UMR 7504 CNRS-Université De Strasbourg 23 rue du Loess; 67034 Strasbourg France

5. Shanghai Synchrotron Radiation Facility; Shanghai Institute of Applied of Physics Chinese Academy of Sciences; Pudong, Shanghai 201204 China

Funder

Agence Nationale de la Recherche

National Natural Science Foundation of China

EGIDE PHC

973 program

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference20 articles.

1. Interface characteristics of Mo/Si and B4C/Mo/Si multilayers using non-destructive X-ray techniques

2. Optical and structural performance of the Al(1%wtSi)/Zr reflection multilayers in the 17–19nm region

3. Chromium oxide as a metal diffusion barrier layer: An x-ray absorption fine structure spectroscopy study

4. Near-edge x-ray absorption fine structure spectroscopy study of nitrogen incorporation in chemically reduced graphene oxide

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