High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes-Reference-Cited by-同舟云学术

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High spatial resolution semi-automatic crystallite orientation and phase mapping of nanocrystals in transmission electron microscopes

Published:2011-04-01 Issue:6 Volume:46 Page:589-606
ISSN:0232-1300
Container-title:Crystal Research and Technology
language:en
Short-container-title:Cryst. Res. Technol.

Author:

Moeck P.,Rouvimov S.,Rauch E. F.,Véron M.,Kirmse H.,Häusler I.,Neumann W.,Bultreys D.,Maniette Y.,Nicolopoulos S.

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference46 articles.

1. Progressive steps in the development of electron backscatter diffraction and orientation imaging microscopy

2. On the formation mechanisms, spatial resolution and intensity of backscatter Kikuchi patterns

3. The Use of Electron Backscatter Diffraction for the Investigation of Nano Crystalline Materials and the Move Towards Orientation Imaging in the TEM

4. Determination of crystal phase from an electron backscatter diffraction pattern

5. Structural fingerprinting in the transmission electron microscope: overview and opportunities to implement enhanced strategies for nanocrystal identification

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