Dependence of calculated electron effective attenuation lengths on transport mean free paths obtained from two atomic potentials-Reference-Cited by-同舟云学术

Dependence of calculated electron effective attenuation lengths on transport mean free paths obtained from two atomic potentials

Published:2006 Issue:10 Volume:38 Page:1348-1356
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Powell C. J.,Jablonski A.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference36 articles.

1. The electron attenuation length revisited

2. Electron effective attenuation lengths for applications in Auger electron spectroscopy and x-ray photoelectron spectroscopy

3. Influence of elastic-electron scattering on measurements of silicon dioxide film thicknesses by x-ray photoelectron spectroscopy

4. Comparisons of calculated and measured effective attenuation lengths for silicon dioxide over a wide electron energy range

5. . In Characterization and Metrology for ULSI Technology 2003, , , , , , , (eds). AIP Conf. Proc. 683 American Institute of Physics: Melville, 2003; 321.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanometer – Thick titanium film as a silicon migration barrier;Materials Today Communications;2024-08

2. Understanding the Mechanism of Electronic Defect Suppression Enabled by Nonidealities in Atomic Layer Deposition;Journal of the American Chemical Society;2019-11-28

3. Simple universal curve for the energy-dependent electron attenuation length for all materials;Surface and Interface Analysis;2012-05-04

4. Elastic photoelectron-scattering effects in quantitative X-ray photoelectron spectroscopy;Surface Science;2012-03

5. Improved analytical formulae for correcting elastic-scattering effects in X-ray photoelectron spectroscopy;Surface Science;2010-02