Characterization of x-rays emerging from between reflector and sample carrier in reflector-assisted TXRF analysis
Author:
Publisher
Wiley
Subject
Spectroscopy
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis;Spectroscopy Letters;2023-11-27
2. Radiation Fluxes Waveguide-Resonance Phenomenon Discovered in Result of X-Ray Nanosize Beam Formation Study;Electromagnetic Propagation and Waveguides in Photonics and Microwave Engineering [Working Title];2020-07-15
3. Formation technology of X-ray quasimonochromatic fluxes with nanosize width and small angular divergence;International Journal of Nanotechnology;2019
4. Recent Advances in TXRF;Applied Spectroscopy Reviews;2006-10
5. Improvement of a TXRF setup to obtain detection limit in the low ppb range;X-Ray Spectrometry;2006
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