Theoretical characterization of reflector-assisted TXRF analysis
Author:
Affiliation:
1. Department of Applied Chemistry, Graduate School of Engineering, Osaka City University, Japan
2. Institute for Materials Research, Tohoku University, Japan
3. PRESTO-JST, Japan
Publisher
Surface Science Society Japan
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology
Link
http://www.jstage.jst.go.jp/article/ejssnt/4/0/4_0_579/_pdf
Reference17 articles.
1. [1] R. Klockenkamper, Total-Reflection X-Ray Fluorescence Analysis (John Wiley & Songs, New York, 1997).
2. Optical Flats for Use in X‐Ray Spectrochemical Microanalysis
3. A method for quantitative X-ray fluorescence analysis in the nanogram region
4. Total-Reflection X-Ray Fluorescence Analysis Using Monochromatic Beam
5. Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures
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