Angle-resolved XPS: a critical evaluation for various applications
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference22 articles.
1. Surface sensitivity and angular dependence of X-ray photoelectron spectra
2. Surface analysis and angular distributions in x-ray photoelectron spectroscopy
3. Parametric analysis of the extraction of depth profile information from ARXPS data obtained on a silicon wafer sample
4. ArCtic ARXPS-Spreadsheet, Crown Copyright 1998, Version 1.0, http://www.npl.co.uk/nanoanalysis/arctick.html, [1998].
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