Short‐Wave Infrared Chip‐Spectrometer by Using Laser Direct‐Writing Grayscale Lithography-Reference-Cited by-同舟云学术

Short‐Wave Infrared Chip‐Spectrometer by Using Laser Direct‐Writing Grayscale Lithography

Published:2022-07-19 Issue:19 Volume:10 Page:
ISSN:2195-1071
Container-title:Advanced Optical Materials
language:en
Short-container-title:Advanced Optical Materials

Author:

Xuan Zhiyi¹²³⁴^ORCID,Wang Zi³⁵,Liu Qingquan¹²³⁴,Huang Songlei³⁶,Yang Bo³⁶,Yang Liyi³⁶,Yin Zhiqin¹³⁴,Xie Maobin¹³⁴,Li Chenlu¹²³⁴,Yu Jingyi⁵,Wang Shaowei¹³⁴^ORCID,Lu Wei¹²³⁴

Affiliation:

1. State Key Laboratory of Infrared Physics Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai 200083 P. R. China

2. School of Physical Science and Technology ShanghaiTech University Shanghai 201210 P. R. China

3. University of Chinese Academy of Sciences Beijing 100049 P. R. China

4. Shanghai Research Center for Quantum Sciences Shanghai 201315 P. R. China

5. School of Information Science and Technology ShanghaiTech University Shanghai 201210 P. R. China

6. State Key Laboratories of Transducer Technology Shanghai Institute of Technical Physics Chinese Academy of Sciences Shanghai 200083 P. R. China

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adom.202200284

Reference48 articles.

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3. Application of hyperspectral remote sensing to cyanobacterial blooms in inland waters

4. Operating principles and detection characteristics of the Visible and Near-Infrared Imaging Spectrometer in the Chang'e-3

5. Detection and calibration characteristics of the visible and near-infrared imaging spectrometer in the Chang’e-4

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