Logic‐in‐Memory Operation of Ternary NAND/NOR Universal Logic Gates using Double‐Gated Feedback Field‐Effect Transistors

Author:

Son Jaemin1,Shin Yunwoo1,Cho Kyoungah1,Kim Sangsig1ORCID

Affiliation:

1. Department of Electrical Engineering Korea University 145 Anam‐ro Seongbuk‐gu Seoul 02841 Republic of Korea

Abstract

AbstractIn this study, the logic‐in‐memory operations are demonstrated of ternary NAND and NOR logic gates consisting of double‐gated feedback field‐effect transistors. The component transistors reconfigure their operation modes into n‐ or p‐channel modes by adjusting the gate biases. The highly symmetrical operation between these operation modes with an excellent on‐current ratio of 1.03 enables three distinguishable and stable logic levels in the ternary logic gates. Moreover, the ternary logic gates maintain the three logic states for several tens to hundreds of seconds under zero‐bias condition. This study demonstrates that the ternary logic gates are promising candidates for next‐generation low‐power computing systems.

Funder

National Research Foundation of Korea

Samsung

Publisher

Wiley

Subject

Electronic, Optical and Magnetic Materials

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