Affiliation:
1. Institut Interdisciplinaire d'Innovation Technologique (3IT) Université de Sherbrooke 3000 Boulevard de l'Université Sherbrooke Quebec J1K 0A5 Canada
2. Laboratoire Nanotechnologies Nanosystèmes (LN2) – CNRS IRL‐3463 Institut Interdisciplinaire d'Innovation Technologique (3IT) Université de Sherbrooke 3000 Boulevard Université Sherbrooke Québec J1K 0A5 Canada
3. Umicore Electro‐Optic Materials Watertorenstraat 33 Olen 2250 Belgium
Abstract
AbstractPorous germanium (PGe) nanostructures attract a lot of attention for various emerging applications due to their unique properties. Consequently, there is an increasing need for the development of low‐cost synthesis routes that are compatible with large‐scale production. Bipolar electrochemical etching (BEE) is a widely used solution for producing porous Ge layers. However, the lack of controllable production of large‐scale uniform PGe layers is the limiting factor for mainstream applications. Large‐scale homogeneous PGe layers formation is demonstrated by improving the BEE process. The PGe structures demonstrate excellent homogeneity in thickness and porosity, with a relative variation of below 2% across the 100 mm wafer. Furthermore, this process enables accurate tuning of the PGe's physical properties through variation of the etching parameters. PGe structures with porosity ranging from 40% to 80% and an adjustable thickness, while preserving low surface roughness are demonstrated, giving access to a large variety of PGe nanostructures for a wide range of applications. Ellipsometry and X‐ray reflectivity are employed to measure the porosity and thickness of PGe layers, providing fast and non‐destructive methods of characterization. These findings lay the groundwork for the large‐scale production of high‐quality PGe layers with on‐demand characteristics.
Funder
Natural Sciences and Engineering Research Council of Canada
Mitacs
Subject
Mechanical Engineering,Mechanics of Materials
Cited by
17 articles.
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