Focussed ion beam and field emission gun-scanning electron microscopy for the investigation of voiding and interface phenomena in thin-film solar cells

Author:

Major Jonathan D.12,Bowen Leon3,Durose Ken12

Affiliation:

1. Department of Physics; University of Durham; South Road Durham DH1 3LE UK

2. Stephensin Institute for Renewable Energy, School of Physical Sciences; University of Liverpool; Chadwick Building Liverpool L69 7ZF UK

3. G. J. Russell Microscopy Facility; University of Durham; South Road Durham DH1 3LE UK

Funder

EPSRC SUPERGEN Initiative

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Cited by 16 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Sodium Fluoride Doping Approach to CdTe Solar Cells;ACS Applied Energy Materials;2022-01-06

2. Effect of annealing on structural, morphological and optical properties of CdTe/(Cd-Zn)S thin films;IOP Conference Series: Materials Science and Engineering;2020-03-01

3. CdTe Solar Cells;A Comprehensive Guide to Solar Energy Systems;2018

4. P3HT as a pinhole blocking back contact for CdTe thin film solar cells;Solar Energy Materials and Solar Cells;2017-12

5. A correlative investigation of grain boundary crystallography and electronic properties in CdTe thin film solar cells;Solar Energy Materials and Solar Cells;2017-07

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