Study of buried junction and uniformity effects in CdTe/CdS solar cells using a combined OBIC and EQE apparatus-Reference-Cited by-同舟云学术

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Study of buried junction and uniformity effects in CdTe/CdS solar cells using a combined OBIC and EQE apparatus

Published:2009-02 Issue:7 Volume:517 Page:2419-2422
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Major J.D.,Durose K.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Conf. Rec. 17th IEEE Photov. Spec. Conf., Kissimmee;Tyan,1984

2. Conf. Rec. 25th IEEE Photov. Spec. Conf., Washington, DC;Rose,1996

3. Physical characterization of thin-film solar cells

4. Materials Research Society Symposium Proceedings 1012 ‘Thin-Film Compound Semiconductor Photovoltaics — 2007’;Davies,2007

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