Thermal, optical, and electrical characterization of thin film coated RTV 655 bilayer system-Reference-Cited by-同舟云学术

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Thermal, optical, and electrical characterization of thin film coated RTV 655 bilayer system

Published:2014-09-17 Issue:3 Volume:132 Page:n/a-n/a
ISSN:0021-8995
Container-title:Journal of Applied Polymer Science
language:en
Short-container-title:J. Appl. Polym. Sci.

Author:

Sabri Firouzeh¹,King Derek S.²,Lokesh Abhi³,Hatch Chris J.¹,Duran Randolph A.⁴

Affiliation:

1. Department of Physics; University of Memphis; Memphis Tennessee 38152

2. Missouri University of Science and Technology; Rolla Missouri 65409

3. Department of Chemistry; University of Florida; Gainesville Florida 32611

4. Department of Chemistry; Louisiana State University; Baton Rouge Louisiana 70803

Publisher

Wiley

Subject

Materials Chemistry,Polymers and Plastics,Surfaces, Coatings and Films,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/app.41396/fullpdf

Reference28 articles.

1. Tensile testing of free-standing Cu, Ag and Al thin films and Ag/Cu multilayers

2. Wettability of naturally aged silicon and EPDM composite insulators

3. Review of aging and recovery of silicone rubber insulation for outdoor use

4. Development of A Shock Absorbing Biomedical Elastomer for A New Total Elbow Replacement Design

5. Within touch of artificial skin

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