Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt-based X-ray photoelectron spectra-Reference-Cited by-同舟云学术

Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt-based X-ray photoelectron spectra

Published:2007 Issue:5 Volume:39 Page:381-391
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Hesse R.,Streubel P.,Szargan R.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference19 articles.

1. Many-electron singularity in X-ray photoemission and X-ray line spectra from metals

2. In Practical Surface Analysis, (eds). John Wiley: Chichester, 1984; 459.

3. In Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, (eds). IM Publications: Chichester, 2003; 861.

4. Peak shape analysis of core level photoelectron spectra using UNIFIT for WINDOWS

5. www.uni-leipzig.de/∼unifit [2006].

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