High-throughput XPS spectrum modeling with autonomous background subtraction for 3 <i>d</i> <sub>5/2</sub> peak mapping of SnS-Reference-Cited by-同舟云学术

High-throughput XPS spectrum modeling with autonomous background subtraction for 3 d _5/2 peak mapping of SnS

Published:2023-01-24 Issue:1 Volume:3 Page:
ISSN:2766-0400
Container-title:Science and Technology of Advanced Materials: Methods
language:en
Short-container-title:Science and Technology of Advanced Materials: Methods

Author:

Matsumura Tarojiro¹^ORCID,Nagamura Naoka²^ORCID,Akaho Shotaro³^ORCID,Nagata Kenji²^ORCID,Ando Yasunobu¹^ORCID

Affiliation:

1. Research Center for Computational Design of Advanced Functional Materials (CD-FMat), National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan

2. Research Center for Advanced Measurement and Characterization, National Institute for Materials Science (NIMS), Tsukuba, Japan

3. Human Informatics and Interaction Research Institute (HIIRI), National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan

Funder

New Energy and Industrial Technology Development Organization

CREST

Materials Research by Information Integration

PRESTO

Japan Science and Technology Agency

Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials

Network Joint Research Center for Materials and Devices

Publisher

Informa UK Limited

Subject

General Medicine

Link

https://www.tandfonline.com/doi/pdf/10.1080/27660400.2022.2159753

Reference41 articles.

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5. Bayesian spectral deconvolution with the exchange Monte Carlo method

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