Artificial peaks in energy dispersive X-ray spectra: sum peaks, escape peaks, and diffraction peaks

Author:

Tanaka Ryohei1,Yuge Koretaka1,Kawai Jun1,Alawadhi Hussain2

Affiliation:

1. Department of Materials Science and Engineering; Kyoto University; Sakyo-ku Kyoto 606-8501 Japan

2. Applied Physics Department, X-ray Center for Material Analysis; University of Sharjah; United Arab Emirates

Publisher

Wiley

Subject

Spectroscopy

Reference13 articles.

1. Resonant Raman scattering as a source of increased background in synchrotron excited X-ray fluorescence;Jaklevic;Anal. Chem.,1988

2. Radiative Auger effect in X-ray fluorescence analysis;Van Espen;Anal. Chem.,1979

3. Chemical effects on the intensity of Ti Kη (radiative Auger satellite) X-ray fluorescence spectra;Kawai;Analyst,1994

4. JIS K0470-2008 Determination of arsenic and lead in clay and sand using energy-dispersiveX-ray fluorescence spectrometry

5. S. Watanabe T. Nakao Shimadzu Application News, No. X238 (LAAN-A-XR038) http://www.an.shimadzu.co.jp/apl/an/x/x238.pdf

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