Application of principal component analysis to a full profile correlative analysis of FTIR spectra-Reference-Cited by-同舟云学术

Application of principal component analysis to a full profile correlative analysis of FTIR spectra

Author:

Broderick Scott R.¹,Suh Changwon¹,Provine J²,Roper Christopher S.³⁴,Maboudian Roya³,Howe Roger T.²,Rajan Krishna¹

Affiliation:

1. Department of Materials Science and Engineering and Institute for Combinatorial Discovery; Iowa State University; Ames IA 50011 USA

2. Department of Electrical Engineering; Stanford University; Stanford CA 94305 USA

3. Department of Chemical Engineering; University of California; Berkeley CA 94720 USA

4. HRL Laboratories, LLC; Malibu CA USA

Funder

DARPA N/MEMS Science and Technology Fundamentals program

Air Force Office of Scientific Research

NSF-ARI program

NSF-CDI Type II program

NSF CRI-IAD

NSF-AF

Army Research Office

Wilkinson Professorship of Interdisciplinary Engineering

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference35 articles.

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