Data scaling for quantitative imaging XPS
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference24 articles.
1. Enhancing and automating TOF-SIMS data interpretation using principal component analysis
2. Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images—looking beyond the obvious
3. Multivariate image analysis methods applied to XPS imaging data sets
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