MOCVD Growth of High-Quality InN Films and Raman Characterization of Residual Stress Effects
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
1. Experimental and theoretical studies of phonons in hexagonal InN
2. Characterization of MOVPE-grown InN layers on α-Al2O3 and GaAs substrates
3. Raman determination of phonon deformation potentials in α-GaN
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