Micro-photoluminescence spectroscopy on metal precipitates in silicon-Reference-Cited by-同舟云学术

Micro-photoluminescence spectroscopy on metal precipitates in silicon

Published:2009-08-13 Issue:7-8 Volume:3 Page:230-232
ISSN:1862-6254
Container-title:physica status solidi (RRL) - Rapid Research Letters
language:en
Short-container-title:phys. stat. sol. (RRL)

Author:

Gundel Paul,Schubert Martin C.,Kwapil Wolfram,Schön Jonas,Reiche Manfred,Savin Hele,Yli-Koski Marko,Sans Juan Angel,Martinez-Criado Gema,Seifert Winfried,Warta Wilhelm,Weber Eicke R.

Funder

project Silicon Beacon

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssr.200903221/fullpdf

Reference13 articles.

1. A fast, preparation‐free method to detect iron in silicon

2. Imaging interstitial iron concentrations in boron-doped crystalline silicon using photoluminescence

3. Transition metal co-precipitation mechanisms in silicon

4. Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface

5. Precipitation of Iron in Polycrystalline Silicon

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