Development of an IEC test for crystalline silicon modules to qualify their resistance to system voltage stress

Author:

Hacke Peter1,Smith Ryan2,Terwilliger Kent1,Perrin Greg1,Sekulic Bill1,Kurtz Sarah1

Affiliation:

1. National Renewable Energy Laboratory (NREL); Golden CO 80401 USA

2. Pordis, LLC; Austin TX 78729 USA

Funder

U.S. Department of Energy with the National Renewable Energy Laboratory

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Renewable Energy, Sustainability and the Environment,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Swanson R Swanson R Cudzinovic M DeCeuster D Desai V Jürgens J Kaminar N Mulligan W Rodrigues-Barbosa L Rose D Smith D Terao A Wilson K The surface polarization effect in high-efficiency silicon solar cells 15th PVSEC 2005

2. Pingel S Frank O Winkler M Daryan S Geipel T Hoehne H Berghold J Potential induced degradation of solar cells and panels 35 th IEEE PVSC 2010 2817 2822

3. IEC 61215 Ed. 2 Crystalline silicon terrestrial photovoltaic (PV) modules - design qualification and type approval 2005

4. Hacke P Terwilliger T Glick S Trudell D Bosco N Johnston S Kurtz S Test-to-failure of crystalline silicon modules 35 th IEEE Photovoltaic Specialists Conference PVSC 2010 244 250 10.1109/PVSC.2010.5614472

5. Koch S Seidel C Grunow P Krauter S Schoppa M Polarization effects and tests for crystalline silicon cells 26 th European Photovoltaic Solar Energy Conference and Exhibition 2011 10.4229/26thEUPVSEC2011-2BV.3.46

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