X-ray micrographic imaging system based on COTS CMOS sensors-Reference-Cited by-同舟云学术

X-ray micrographic imaging system based on COTS CMOS sensors

Published:2018-06-04 Issue:10 Volume:46 Page:1848-1857
ISSN:0098-9886
Container-title:International Journal of Circuit Theory and Applications
language:en
Short-container-title:Int J Circ Theor Appl

Author:

Alcalde Bessia Fabricio¹²³,Pérez Martin¹²,Lipovetzky José¹²³^ORCID,Piunno Natalia Alejandra³,Mateos Horacio²,Sidelnik Iván⁴²³,Blostein Juan Jerónimo⁴²³,Sofo Haro Miguel¹²³,Gómez Berisso Mariano¹²³

Affiliation:

1. Laboratorio de Bajas Temperaturas and División de Física Médica; Centro Atómico Bariloche, CNEA; Av. Bustillo 9500 San Carlos de Bariloche Argentina

2. Instituto Balseiro; Av. Bustillo 9500 San Carlos de Bariloche Argentina

3. Consejo Nacional de Investigaciones Científicas y Técnicas; Buenos Aires Argentina

4. División de Física de Neutrones; Centro Atómico Bariloche, CNEA; Av. Bustillo 9500 San Carlos de Bariloche Argentina

Funder

Agencia Nacional de Promoción Científica y Tecnológica

Consejo Nacional de Investigaciones Científicas y Técnicas

Universidad Nacional de Cuyo

Publisher

Wiley

Subject

Applied Mathematics,Electrical and Electronic Engineering,Computer Science Applications,Electronic, Optical and Magnetic Materials

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/cta.2502/fullpdf

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