Variability Analysis of Inverter Delay Time

Author:

Aoki Masakazu,Hasegawa Ken,Itayama Keisuke,Yamawaki Taizo,Tanaka Satoshi

Publisher

Wiley

Subject

Electrical and Electronic Engineering

Reference15 articles.

1. Masuda H Ohkawa S Kurokawa A Aoki M. Challenge: variability characterization and modeling for 65- to 90-nm process. CICC Digest of Technical Papers 2005 593 600.

2. Nassif SR. Process variability at 65 nm node and beyond. CICC Digest of Technical Papers 2008 1 8.

3. Itoh K. Adaptive circuits for the 0.5-V nanoscale CMOS era. ISSCC Digest of Technical Papers 2009 14 20.

4. Chen TC. Where CMOS is going: trendy hype vs. real technology. ISSCC Digest of Technical Papers 2006 22 28.

5. Nho H Kolar P Hamzaoglu F Wang Y Karl E Ng Y-G Bhattacharya U Zhang K. A 32 nm high-k metal gate SRAM with adaptive dynamic stability enhancement for low-voltage operation. ISSCC Digest of Technical Papers 2010 346 347.

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