Multifractal analysis of sputtered CaF2thin films-Reference-Cited by-同舟云学术

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Multifractal analysis of sputtered CaF2thin films

Published:2013-10-18 Issue:11-12 Volume:45 Page:1775-1780
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Yadav R. P.¹,Pandey R. K.²,Mittal A. K.,Dwivedi S.³,Pandey A. C.

Affiliation:

1. Department of Physics; University of Allahabad; Allahabad; Uttar; 211002; India

2. Nanotechnology Application Centre; University of Allahabad; Allahabad; Uttar; 211002; India

3. K. Banerjee Centre of Atmospheric and Ocean Studies; University of Allahabad; Allahabad; Uttar; 211002; India

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference30 articles.

1. Investigating atomic details of the CaF2(111) surface with a qPlus sensor

2. MBE-growth peculiarities of fluoride (CdF2–CaF2) thin film structures

3. Growth and microstructure of Si/CaF 2 /Si(111) heterostructures

4. Homogeneous Si films on CaF2/Si(111) due to boron enhanced solid phase epitaxy

5. Epitaxial growth of Fe3Si/CaF2/Si(111) hybrid structures by molecular beam epitaxy

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