Improvement in detection limits by using helium ions for particle-induced x-ray emission-Reference-Cited by-同舟云学术

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Improvement in detection limits by using helium ions for particle-induced x-ray emission

Published:2005 Issue:4 Volume:34 Page:393-399
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Beck Lucile

Publisher

Wiley

Subject

Spectroscopy

Reference36 articles.

1. , . PIXE: a Novel Technique for Elemental Analysis. Wiley: Chichester, 1988.

2. , , . Particle-induced X-ray Emission Spectrometry (PIXE). Wiley: Chichester, 1995.

3. , . Les Techniques de l'Ingénieur. 2003-2004; P 2557-P 2558.

4. X-ray analysis: Elemental trace analysis at the 10−12 g level

5. Analytical application of particle induced X-ray emission

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