Error minimization in the envelope method for the determination of optical constants of a thin film
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.3188/fullpdf
Reference17 articles.
1. Methods for the determination of the optical constants of thin films from single transmission measurements: a critical review
2. A simple method for the determination of the optical constants n, k and the thickness of a weakly absorbing thin film
3. Determination of the thickness and optical constants of amorphous silicon
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