Impedance spectroscopy of polysilicon in SOI structures

Author:

Druzhinin Anatoly,Ostrovskii Ihor,Khoverko Yuriy,Nichkalo Stepan,Kogut Iurii

Publisher

Wiley

Subject

Condensed Matter Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Crossover From Quantum Mechanical Tunneling to the Superlinear Power Law in Silicon Microcrystal, Doped by Boron and Nickel;Journal of Low Temperature Physics;2024-02-28

2. Low Temperature Parameters of Exchange Interaction of the Polycrystalline Layers in SOI-Structures;2022 IEEE 41st International Conference on Electronics and Nanotechnology (ELNANO);2022-10-10

3. Оцінка низькотемпературних параметрів обмінної взаємодії полікристалічних шарів в КНІ-структурах;Information and communication technologies, electronic engineering;2021-12

4. L-C- Electronic Elements Based on Silicon Microstructures;2020 IEEE XVIth International Conference on the Perspective Technologies and Methods in MEMS Design (MEMSTECH);2020-04

5. Frequency response in polycrystalline silicon films of SemOI-structures;2020 IEEE 15th International Conference on Advanced Trends in Radioelectronics, Telecommunications and Computer Engineering (TCSET);2020-02

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