Scan‐Free Grazing Emission XRF Measurements in the Laboratory Using a CCD
Author:
Affiliation:
1. Technical University of BerlinInstitute for Optics and Atomic PhysicsHardenbergstraße 36D‐10623 BerlinGermany
Funder
Deutsche Forschungsgemeinschaft
Publisher
Wiley
Subject
Condensed Matter Physics
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.201700158
Reference21 articles.
1. Grazing-emission X-ray fluorescence spectrometry; principles and applications
2. Depth profiles of Al impurities implanted in Si wafers determined by means of the high-resolution grazing emission X-ray fluorescence technique
3. X-Ray Evanescent-Wave Absorption and Emission
4. Comparison of Grazing Emission XRF with Total Reflection XRF and Other X-Ray Emission Techniques
5. Laboratory grazing‐emission x‐ray fluorescence spectrometer
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