Spatially‐Resolved Spectroscopic Characterization of Reflective and Transparent Materials at a Micro‐Meter Scale Using Coherence Scanning Interferometry-Reference-Cited by-同舟云学术

Spatially‐Resolved Spectroscopic Characterization of Reflective and Transparent Materials at a Micro‐Meter Scale Using Coherence Scanning Interferometry

Published:2017-11-24 Issue:12 Volume:14 Page:1700157
ISSN:1862-6351
Container-title:physica status solidi c
language:en
Short-container-title:physica status solidi c

Author:

Claveau Rémy¹²^ORCID,Montgomery Paul C.²^ORCID,Flury Manuel¹²^ORCID

Affiliation:

1. Laboratoire des Sciences de l'Ingénieur, de l'Informatique et de l'Imagerie (ICube), Université de Strasbourg‐CNRSUMR 7357, 23 rue du Loess, 67037 StrasbourgF‐67412 Illkirch cedexFrance

2. Institut National des Sciences Appliquées de Strasbourg (INSA Strasbourg)24 Boulevard de la Victoire67084 Strasbourg cedexFrance

Funder

Université de Strasbourg

Publisher

Wiley

Subject

Condensed Matter Physics

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssc.201700157

Reference15 articles.

1. High speed implementation of a three-dimensional shape profiler with submillimeter precision using a digital light processing device and a new efficient algorithm for absolute phase retrieval

2. Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopy