Multi-frequency electron spin resonance study of inherent Si dangling bond defects at the thermal (211)Si/SiO2interface
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Published:2014-08-08
Issue:11-12
Volume:11
Page:1589-1592
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ISSN:1862-6351
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Container-title:physica status solidi (c)
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language:en
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Short-container-title:Phys. Status Solidi C
Author:
Iacovo S.,Stesmans A.
Subject
Condensed Matter Physics
Cited by
2 articles.
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