Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: a comparative study-Reference-Cited by-同舟云学术

Study of the morphology of NiO nanostructures grown on highly ordered pyrolytic graphite, by the Tougaard method and atomic force microscopy: a comparative study

Published:2010-03-16 Issue:6-7 Volume:42 Page:869-873
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Preda I.,Soriano L.,Alvarez L.,Méndez J.,Yubero F.,Gutiérrez A.,Sanz J. M.

Funder

Spanish Ministerio de Ciencia e Innovación

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.3222/fullpdf

Reference19 articles.

1. Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape

2. S. Tougaard QUASES, Software package for quantitative XPS/AES of surface nanostructures by inelastic peak shape analysis ww.QUASES.com

3. Atomic force microscope study of the early stages of NiO deposition on graphite and mica

4. Use of factor analysis and XPS to study defective nickel oxide

5. The preparation of thin ordered transition metal oxide films on metal single crystals for surface science studies

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