Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials-Reference-Cited by-同舟云学术

Advanced XPS characterization: XPS-based multi-technique analyses for comprehensive understanding of functional materials

Published:2021 Issue:22 Volume:5 Page:7931-7963
ISSN:2052-1537
Container-title:Materials Chemistry Frontiers
language:en
Short-container-title:Mater. Chem. Front.

Author:

Isaacs Mark A.¹²^ORCID,Davies-Jones Josh²³^ORCID,Davies Philip R.²³^ORCID,Guan Shaoliang²³,Lee Roxy¹^ORCID,Morgan David J.²³^ORCID,Palgrave Robert¹²^ORCID

Affiliation:

1. Department of Chemistry, University College London, 20 Gordon St, Bloomsbury, London WC1H 0AJ, UK

2. HarwellXPS, Research Complex at Harwell, Rutherford Appleton Laboratories, Harwell, OX11 0FA, UK

3. School of Chemistry, Cardiff University, Park Place, Cardiff, CF10 3AT, UK

Abstract

X-ray photoelectron spectroscopy (XPS) has achieved maturity as an analytical technique in the materials community, however as made apparent by recent reviews highlighting it's misuse, it is a practice which is often misunderstood.

Funder

Engineering and Physical Sciences Research Council

Publisher

Royal Society of Chemistry (RSC)

Subject

Materials Chemistry,General Materials Science

Link

http://pubs.rsc.org/en/content/articlepdf/2021/QM/D1QM00969A

Reference390 articles.

1. Heterogeneous Catalysis

2. Hierarchically Structured Porous Materials for Energy Conversion and Storage

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