General Model for Charge Carriers Transport in Electrolyte‐Gated Transistors

Author:

Luginieski Marcos12ORCID,Koehler Marlus3ORCID,Serbena José P. M.3ORCID,Seidel Keli F.1ORCID

Affiliation:

1. Universidade Tecnológica Federal do Paraná ‐ UTFPR Departamento Acadêmico de Física Av. Sete de Setembro, 3165 Curitiba CEP 80230‐901 Brazil

2. Instituto de Física de São Carlos Universidade de São Paulo Departamento de Física e Ciências dos Materiais CP 369 São Carlos SP CEP 13660‐970 Brazil

3. Universidade Federal do Paraná ‐ UFPR Centro Politécnico, Departamento de Física Jardim das Américas CP 19044 Curitiba CEP 81531‐990 Brazil

Abstract

AbstractA charge carrier transport model able to describe the typical modes of operation and some non‐ideal ones from electrolyte‐gated field effect transistors and organic electrochemical transistors (OECTs) is proposed. The analysis include the effect of 2D or 3D percolation transport (PT) and the influence of a shallow exponential trap distribution on the transport. Under these considerations, a non‐constant accumulation layer thickness along the channel can be formed, resulting in a non‐constant effective mobility. The accumulation thickness can depict 2D or 3D PT or even a transition between them. This transition can produce a non‐ideal profile between the linear and saturation regimes in the output curve, region in which a lump appears. Other analyzed phenomenon is the non‐linear behavior for low drain voltage in the output curve, even considering an ohmic contact. This phenomenon is attributed to the traps distribution profile into the semiconductor and the thin accumulation layer thickness close to the injection contact. The conditions when the linear field effect mobility is higher or lower than the saturation one is also analyzed. Finally, electrolyte‐gated organic field effect transistors and OECT experimental data are successfully fitted with this model showing its versatility.

Funder

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

Publisher

Wiley

Subject

Multidisciplinary,Modeling and Simulation,Numerical Analysis,Statistics and Probability

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3