1. A. Beg W. Ibrahim Relating reliability to circuit topology
2. A. Beg A. Elchouemi Effect of channel lengthening and threshold voltage variation on a nanometric gate's delay and power
3. A. Beg A. Elchouemi Enhancing Static Noise Margin While Reducing Power Consumption
4. J.-Y. Lin W.-Z. Shen J.-Y. Jou A power modeling and characterization method for the CMOS standard cell library