Emergent Topological Hall Effect at a Charge‐Transfer Interface-Reference-Cited by-同舟云学术

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Emergent Topological Hall Effect at a Charge‐Transfer Interface

Published:2020-11-16 Issue:50 Volume:16 Page:2004683
ISSN:1613-6810
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Author:

Lim Zhi Shiuh¹²^ORCID,Li Changjian¹³^ORCID,Huang Zhen¹²^ORCID,Chi Xiao²⁴^ORCID,Zhou Jun²^ORCID,Zeng Shengwei¹²^ORCID,Omar Ganesh Ji¹²^ORCID,Feng Yuan Ping²^ORCID,Rusydi Andrivo²⁴^ORCID,Pennycook Stephen John³^ORCID,Venkatesan Thirumalai¹²³^ORCID,Ariando Ariando¹²^ORCID

Affiliation:

1. NUSNNI‐NanoCore National University of Singapore Singapore 117411 Singapore

2. Department of Physics National University of Singapore Singapore 117542 Singapore

3. Department of Materials Science and Engineering National University of Singapore Singapore 117575 Singapore

4. Singapore Synchrotron Light Source (SSLS) National University of Singapore 5 Research Link Singapore 117603 Singapore

Funder

Agency for Science, Technology and Research

National University of Singapore

National Research Foundation Singapore

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/smll.202004683

Reference82 articles.

1. Antiferromagnetic spintronics

2. Antiferromagnetic spintronics

3. Electrical switching of an antiferromagnet

4. Magnetic Domain-Wall Racetrack Memory

5. Current-Controlled Magnetic Domain-Wall Nanowire Shift Register

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