Recent Progress on the Scanning Tunneling Microscopy and Spectroscopy Study of Semiconductor Heterojunctions-Reference-Cited by-同舟云学术

Recent Progress on the Scanning Tunneling Microscopy and Spectroscopy Study of Semiconductor Heterojunctions

Author:

Peng Wenbing¹,Wang Haolin¹,Lu Hui²,Yin Lei¹,Wang Yue¹,Grandidier Bruno³^ORCID,Yang Deren¹²,Pi Xiaodong¹²^ORCID

Affiliation:

1. State Key Laboratory of Silicon Materials and School of Materials Science and Engineering Zhejiang University Hangzhou Zhejiang 310027 China

2. Institute of Advanced Semiconductors Hangzhou Innovation Center Zhejiang University Hangzhou Zhejiang 311215 China

3. Univ. Lille CNRS Centrale Lille Univ. Polytechnique Hauts‐de‐France Junia‐ISEN, UMR 8520 – IEMN Lille 59000 France

Funder

National Key Research and Development Program of China

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Link

Reference141 articles.

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献