Emission of MCs+ secondary ions from semiconductors by caesium bombardment
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference13 articles.
1. Evaluation of a cesium positive ion source for secondary ion mass spectrometry
2. Quantitative analysis and depth profiling of rare gases in solids by secondary‐ion mass spectrometry: Detection of (CsR)+ molecular ions (R=rare gas)
3. A new secondary ion mass spectrometry technique for III‐V semiconductor compounds using the molecular ions CsM+
4. On the use of CsX+ cluster ions for major element depth profiling in secondary ion mass spectrometry
5. SIMS depth profile analysis using MCs+ molecular ions
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