Present limits to the calculation of auger line intensities for film-substrate systems
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
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4. Quantitative AES VII. The ionization cross-section in AES;Surface and Interface Analysis;1998-10
5. Backscattering Factor for KLL Auger Yield from Film-Substrate Systems;Surface and Interface Analysis;1996-01
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